Electrical test probe having integral strain relief and ground connection.

摘要

An improved electrical test probe has a electrically conductive strain relief adapter mounted on a substrate for accepting a conductive cable having a central conductor and an outer shielding conductor separated by a dielectric layer. The conductive cable is inserted into the strain relief adapter with the outer shielding conductor in electrical contact with the adapter. The substrate is disposed within an electrically conductive elongate hollow body with the body being deformed proximate the location of the strain relief adapter to secure the substrate in the body and to provide electrical continuity between the the outer shielding conductor and the substrate and the outer shielding conductor and the hollow body. The adapter further provides strain relief for the center conductor of the conductive cable and mechanical support for the substrate.