| 摘要 |
PURPOSE:To turn a sample around only one axis and facilitate the secure detection of a deflected X-ray with this turning only and eliminate trial and error. CONSTITUTION:A warped-type X-ray detector 18 and an X-ray half-shutter 22 are mounted on a traveling table 24 and can travel along a y-axis direction. The traveling table 24 is made to travel so as to correspond to the object crystal lattice plane of a single crystal and positioned so as to detect a deflected X-ray from the crystal lattice plane. While the X-ray half-shutter 22 is removed from the sensing region of the detector 18, a sample 14 is turned and, when the deflected X-ray is detected, the turning angle omega1 of the sample 14 at that time is measured. In that state, the half-shutter 22 is turned around the y-axis and a position where the detected intensity of the deflected X-ray is halved is found and the turning angle phi1 of the half-shutter 22 at that time is measured. The same process is performed for the other crystal lattice plane and the respective turning angles omega2 and phi2 are measured. The azimuth of the single crystal sample 14 is obtained from the angles omega1, phi1, omega2 and phi2. |
