发明名称 |
Aufgeteiltes Grenzabtasttesten zum Vermindern des durch Testen hervorgerufenen Schadens |
摘要 |
A partitioned boundary-scan interconnect test method for loaded printed wiring boards (PWB's) is disclosed which reduces testing-induced damage to electronic components. The method is adapted to expeditiously identify all short-circuits on a PWB. The partitioned boundary-scan interconnect test includes four sub-tests. A powered shorts boundary-scan sub-test searches for short-circuit faults between conventional nets and boundary-scan nets. A boundary-scan interconnect shorts sub-test searches for short-circuits between boundary-scan nets. The boundary-scan interconnect shorts sub-test is optimized by testing a single driver on each net. All other drivers are tested during a boundary-scan bus-wire sub-test. A boundary-scan in-circuit sub-test checks the connectivity of boundary-scan devices in partial boundary-scan nets (i.e., nets having a driver or receiver but not both). By partitioning the boundary-scan interconnect test into these sub-tests, the potential for testing-induced damage is reduced. |
申请公布号 |
DE4243910(A1) |
申请公布日期 |
1993.11.18 |
申请号 |
DE19924243910 |
申请日期 |
1992.12.23 |
申请人 |
HEWLETT-PACKARD CO., PALO ALTO, CALIF., US |
发明人 |
PARKER, KENNETH P., FORT COLLINS, CONN., US |
分类号 |
G01R31/28;G01R31/3185;(IPC1-7):G01R31/30 |
主分类号 |
G01R31/28 |
代理机构 |
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地址 |
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