发明名称 TEST SYSTEM FOR DATA PROCESSOR
摘要 PURPOSE:To easily specify a defective position by making an unmatching position clear and outputting a message if an error is detected in test instruction execution. CONSTITUTION:A test data setting means sets test data in control storage 19 and a buffer 18 by using a diagnostic instruction. Then a test instruction sequence part 11 executes a test instruction sequence. This test instruction string is executed by an instruction processor 17 in the data processor under the influence of the buffer 18 and control storage 19. After the execution of the test instruction sequence ends, the data in the control storage 19 and buffer 18 are read out to an execution result saving part 14 by the control storage 19 and a buffer data reading means. An expected value-test result comparing decision means compares the data, read out to the execution result saving part 14 with expected value data in an expected value saving part 13 and when a discrepancy is decided, a message output part 16 outputs the unmatching information message wherein the contents are made clear.
申请公布号 JPH05303510(A) 申请公布日期 1993.11.16
申请号 JP19920107334 申请日期 1992.04.27
申请人 HITACHI LTD;HITACHI ELECTRON SERVICE CO LTD 发明人 MATSUMORI KAZUNARI;SUZUKI KAZUHIRO;SUGIMOTO MITSUHIRO;KONDO KUNIAKI
分类号 G06F11/22 主分类号 G06F11/22
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