发明名称 |
BASE PLATE FOR EPITAXIAL GROWTH AND METHOD FOR EPITAXIAL GROWTH |
摘要 |
PURPOSE:To enable great reduction in tear-like defects occurring on the surface of an epitaxial layer and improve the smoothness of the growing layer surface. CONSTITUTION:In the growth of an epitaxial layer by vapor-phase growth on the base plate of a semi-conductor single crystal, the base plate used satisfies the inequality: 0.011sq. rt. V<3>+6.21X10<20>/sq. rt. T<15=theta<=0.20 wherein the growth rate = V, growth temperature = T; the inclination angle from the direction of the effective utilization area of the surface <100>=theta, and 0.1<=V<=10(mum/Hr) and 853<=T<=1023(K). |
申请公布号 |
JPH05301795(A) |
申请公布日期 |
1993.11.16 |
申请号 |
JP19920131811 |
申请日期 |
1992.04.23 |
申请人 |
JAPAN ENERGY CORP |
发明人 |
NAKAMURA MASASHI;KATSURA SHIGEO;HIRANO RYUICHI;MAKINO NAGAHITO;IKEDA EIJI |
分类号 |
C30B25/16;C30B25/02;C30B25/18;C30B29/40;H01L21/20;H01L21/205;(IPC1-7):C30B25/18 |
主分类号 |
C30B25/16 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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