DEVICE FOR INSPECTING MOUNTED SUBSTRATE APPEARANCE

摘要

PURPOSE:To provide the device for inspecting mounted substrate appearance capable of high-speed processing by improving the test accuracy of improperly mounted parts. CONSTITUTION:Laser light 16 is scanned on a printed substrate 11 with parts 12 mounted to calculate height data by means of a picture arithmetic operation processing means 24. A parts position correcting circuit 25 calculates the position of parts 12, calculating the deviation amount (correction amount) from the standard point. A recognition arithmetic processing means 26 moves the test area based on the correction amount to calculate the state of the parts 12. A discrimination processing means 28 compares the state of the parts 12 calculated by the recognition arithmetic operation processing means 26 with the threshold value for discrimination stored in a threshold value storage means 27 for discrimination. By correcting the test area, the state of mounting can be discriminated without affected by the position deviation of the parts 12. The center is calculated for each parts 12, enabling the correction of a plurarity of test areas at the same time.