发明名称 |
Method of making a semiconductor memory device having error checking/correcting functions |
摘要 |
A semiconductor memory device having error checking/correcting functions includes a circuit (10) for generating a code for error checking/correcting based on information externally supplied and linking the information and the code to be transmitted to a memory cell array (1), and another circuit (11) for error checking and correcting read-out information from the information and the code which are read-out from the memory cell array so as to output correct read-out information. The code word generating circuit (10) and the error checking/correcting circuit (11) are formed of a masked ROM integrated on the same semiconductor chip (100) as that of the memory cell array (1) in the memory device.
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申请公布号 |
US5262342(A) |
申请公布日期 |
1993.11.16 |
申请号 |
US19910771891 |
申请日期 |
1991.10.07 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
TOYAMA, TSUYOSHI;KOBAYASHI, SHINICHI;NOGUCHI, KENJI |
分类号 |
G06F11/10;(IPC1-7):H01L21/70 |
主分类号 |
G06F11/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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