发明名称 SEMICONDUCTOR DEVICE
摘要 PURPOSE:To secure moisture resistance by arranging first resin at the periphery of the under face of a chip part, and arranging second resin smaller in permittivity than it inside the first resin. CONSTITUTION:First resin 5 is arranged at the periphery of the under face of a chip part 4, which includes a section where a bump electrode 1 is formed, and second resin 6 smaller in permittivity than the first resin 5 is arranged inside the first resin 5 at the under face of a chip part 4. That is, since the first resin 5 for reinforcing the bump electrode 1 exists only at the periphery of the under face of the chip part 4, and the second resin 6 existing at the center of the under face of the chip part 4 is smaller in permittivity than the first resin 5, the influence on the operation of the chip part 4 is small. Hereby, the first resin 5 secures the reliability on the bump electrode 1, and the second resin 6 controls the deterioration of the properties of an arithmetic circuit of the first chip 4 or a signal transmission line 3, whereby the reliability on moisture resistance, etc., can be secured.
申请公布号 JPH05299450(A) 申请公布日期 1993.11.12
申请号 JP19920104905 申请日期 1992.04.23
申请人 SHARP CORP 发明人 YOSHIMASU TOSHIHIKO
分类号 H01L21/56;H01L21/321;H01L21/60;H01L23/12;H01L23/15;H01L23/28;H01L23/29;H01L23/31 主分类号 H01L21/56
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