发明名称 TEST SYSTEM
摘要 PURPOSE:To realize the test system easy to recognize the structure of a testing device with easy construction and maintenance. CONSTITUTION:In the testing system performing the test simulation by means of a virtual testing device constructed by software, a definition information file is prepared for each testing device to be stored in a memory 3. A device list display means 4 refers to the storage data of the memory 3 to display the constructed testing device on a display 1. When the testing device is selected on the screen, a device structure list display means 5 refers to the storage data of the memory, displaying each element consisting of the selected testing device on the display device 1. Further, when an element is selected by an input means 2 on the screen displaying each element in tree system, a definition means 6 refers to the storage data of the memory 3 to display data defining the selected elements on the display device 1. In this case, the data displayed through the input of the input means 2 can be defined.
申请公布号 JPH05298281(A) 申请公布日期 1993.11.12
申请号 JP19920096264 申请日期 1992.04.16
申请人 YOKOGAWA ELECTRIC CORP 发明人 KATO MITSUNORI
分类号 G01D21/00;G06Q50/00;G06Q50/10 主分类号 G01D21/00
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