发明名称 |
METHOD FOR FORMING TEST VECTOR |
摘要 |
PURPOSE:To easily form a test vector after changing a design. CONSTITUTION:Design specification 1 is supplied to a logical value computing part 2 and logical specification 3 is extracted from the computing part 2. On the other hand, the design specification 1 is supplied also to a hardware specification processing part 4 and a hardware-like specifiction 5 to be used for developing a circuit to hardware is extracted from the processing part 4. Then these specifications 3, 5 are supplied to a test vector forming part 6. A test vector 7 is outputted from the forming part 6. |
申请公布号 |
JPH05298388(A) |
申请公布日期 |
1993.11.12 |
申请号 |
JP19920101261 |
申请日期 |
1992.04.21 |
申请人 |
SONY CORP |
发明人 |
OYA NOBORU;HATTORI MASAYUKI;SASANO MITSURU |
分类号 |
G01R31/3183;G01R31/28;G06F11/22;G06F11/25;G06F11/26;G06F17/50 |
主分类号 |
G01R31/3183 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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