发明名称 METHOD FOR FORMING TEST VECTOR
摘要 PURPOSE:To easily form a test vector after changing a design. CONSTITUTION:Design specification 1 is supplied to a logical value computing part 2 and logical specification 3 is extracted from the computing part 2. On the other hand, the design specification 1 is supplied also to a hardware specification processing part 4 and a hardware-like specifiction 5 to be used for developing a circuit to hardware is extracted from the processing part 4. Then these specifications 3, 5 are supplied to a test vector forming part 6. A test vector 7 is outputted from the forming part 6.
申请公布号 JPH05298388(A) 申请公布日期 1993.11.12
申请号 JP19920101261 申请日期 1992.04.21
申请人 SONY CORP 发明人 OYA NOBORU;HATTORI MASAYUKI;SASANO MITSURU
分类号 G01R31/3183;G01R31/28;G06F11/22;G06F11/25;G06F11/26;G06F17/50 主分类号 G01R31/3183
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