Semiconductor memory having built-in test circuit,申请号US19910648795-传众专利搜索

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发明名称	Semiconductor memory having built-in test circuit
摘要
申请公布号	US5260906(A)	申请公布日期	1993.11.09
申请号	US19910648795	申请日期	1991.01.31
申请人	NEC CORPORATION	发明人	MIZUKAMI, TAKESHI
分类号	G11C29/00;G11C29/12;G11C29/28;G11C29/34;(IPC1-7):G11C29/00;G06F11/00	主分类号	G11C29/00
代理机构		代理人
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