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发明名称
Mask and charged particle beam exposure method using the mask
摘要
申请公布号
US5256881(A)
申请公布日期
1993.10.26
申请号
US19920896715
申请日期
1992.06.10
申请人
FUJITSU LIMITED
发明人
YAMAZAKI, SATORU;YASUDA, HIROSHI;SAKAMOTO, KIICHI
分类号
H01L21/027;H01J37/317;H01L21/30;(IPC1-7):H01J37/302
主分类号
H01L21/027
代理机构
代理人
主权项
地址
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