发明名称 |
MAKING METHOD OF CONTACT HOLE |
摘要 |
The contact for LSI device is prepared by forming a silicon oxide film on the exposed drain and source and gate electrode having a spacer oxide and mask oxide film, forming and reflowing BPSG silm thickly, cleaning it with NH4OH, etch-backing thinly, reforming a thick silicon oxide film, removing the upper silicon oxide film of the contact area, cleaning the BPSG film of the contact area with NH4OH, blanket etching the lower silicon oxide film to expose the drain, and the upper silicon oxide film of no contact area concurrently, depositing a bitline conductive film on all area, mask patterning the bitline connected with the drain.
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申请公布号 |
KR930010082(B1) |
申请公布日期 |
1993.10.14 |
申请号 |
KR19910015312 |
申请日期 |
1991.09.03 |
申请人 |
HYUNDAI ELECTRONICS CO., LTD. |
发明人 |
PARK, CHOL - SU;PARK, YONG - JIN;KIM, JONG - CHOL;PARK, HON - SOP;CHON, HUI - KON |
分类号 |
H01L21/28;H01L23/52;(IPC1-7):H01L23/52 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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