发明名称
摘要 PURPOSE:To progress automatically a unit test of a device to be measured by setting the measuring condition and procedure of the device to be measured to a simulator, controlling the operation of the device to be measured and applying a processing in conformity to the set condition to its transmitted signal. CONSTITUTION:The measuring condition such as a line characteristic and a range of S/N desired to be measured is inputted from a measuring condition procedure setting device 108. These measuring condition and procedure are stored in an RAM104. The start of measurement is indicated from the device 108 and the measurement is started. A CPU102 of the simulator 100 reads a designated characteristic among the line characteristics stored in a memory 106 by the setting device 108 and loads it to a digital signal processing processor 110. Then, a transmission section 202 of a modulator-demodulator 200 is started to transmit the signal. The CPU102 starts the transmission section 202, the receiving section 204 and a data analyzer 220, which measures an error rate or the like.
申请公布号 JPH0572775(B2) 申请公布日期 1993.10.13
申请号 JP19830085085 申请日期 1983.05.17
申请人 RICOH KK 发明人 TANAKA SHIGETAKA
分类号 H04B17/00;H04B3/46 主分类号 H04B17/00
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