| 摘要 |
PURPOSE:To execute easily a logic test by connecting a prescribed test section with an AND array forming a programmable logic array. CONSTITUTION:Switching MOSFETs Q (Q1-Q'm) are provided while being connected to each product term line P (P1-P'm), and a test wire It prolonged to the product term lines P while intersecting orthogonally with them is provided. Further, a storage element Mt is provided at a cross point between the product term lines P and the test line It. Consequently the test section C is formed by them. Each FET Q is subjected to ON-OFF control selectively by a control line D (D1,D2). In conducting the logic test, input lines I (I1-In) are all brought into a low level, a test signal is fed to the test line It and the FETs Q are controlled selectively. Thus, the logic test is executed easily. |
