MEMBRANE-BASED IC TEST PROBE WITH PRECISELY POSITIONED CONTACTS,申请号EP19890300688-传众专利搜索

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发明名称	MEMBRANE-BASED IC TEST PROBE WITH PRECISELY POSITIONED CONTACTS
摘要
申请公布号	EP0331282(B1)	申请公布日期	1993.10.13
申请号	EP19890300688	申请日期	1989.01.25
申请人	HEWLETT-PACKARD COMPANY	发明人	FOSTER, JACK, D.;GREENSTEIN, MICHAEL;HUFF, RICHARD;LESLIE, BRIAN C.;MATTA, FARID
分类号	G01R31/26;G01R1/073;H01L21/66;H01R11/18	主分类号	G01R31/26
代理机构		代理人
主权项
地址

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