发明名称 Semiconductor device having overlapping conductor layers
摘要 A semiconductor device includes a semiconductor substrate, an active layer formed on the semiconductor substrate, source and drain electrodes respectively formed on the active layer, a gate electrode formed on the active layer between the source and drain electrodes and including a gate contact portion which makes contact with the active layer and has a thickness greater than those of the source and drain electrodes and an overgate portion which is connected to the gate contact portion and extends over at least a portion of one of the source and drain electrodes, a first insulator layer formed on the active layer and covering the source and drain electrodes and the gate contact portion, a first contact hole in the first insulator layer through which the overgate portion connects to the one of the source and drain electrodes, a second insulator layer formed on the first insulator layer and covering the overgate portion, a second contact hole in the second insulator layer at a position above the overgate portion, and an interconnection layer formed on the second insulator layer and connected to the overgate portion via the second contact hole.
申请公布号 US5252843(A) 申请公布日期 1993.10.12
申请号 US19910809041 申请日期 1991.12.16
申请人 FUJITSU LIMITED 发明人 SUZUKI, MASAHISA
分类号 H01L21/285;H01L21/338;H01L21/8252;H01L27/06;H01L27/095;(IPC1-7):H01L29/80;H01L31/112 主分类号 H01L21/285
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