| 摘要 |
The invention relates to a method for determining the concentration of a gas in a molten metal by means of a carrier gas which can be delivered to at least one analyser, optionally either for calibration purposes via a direct route, or for measurement purposes via a measuring circuit containing a probe dipped into the molten metal, the carrier gas, for the purpose of measuring, becoming involved in a gas exchange with the molten metal, and this gas mixture being delivered to the analyser. In order to determine the concentration of a gas in a molten metal very rapidly and accurately, the carrier gas is delivered, for one measurement cycle in a section, both directly to the analyser for the purpose of calibration, and to the measurement circuit for flushing and for taking up the gas to be measured, in such a way that the gas to be measured is available at the analyser, that the carrier gas is then delivered, via the measuring circuit, at least in part to the at least one analyser, and that a partial pressure is calculated as a first approximate value for the partial pressure of the gas to be measured in the molten metal after the gas exchange with the molten metal. <IMAGE> |
