发明名称 REFLECTIVITY MEASURING APPARATUS
摘要 <p>PURPOSE:To obtain a reflectivity measuring apparatus, which can avoid the interference between the reflected light from a surface to be measured and the reflected light from the surface of a coating layer and can positively measure the reflectivity for the surface to be measured when the reflectivity of the surface to be measured having the coating layer is measured. CONSTITUTION:Laser light L is cast on a surface, whose reflectivity is measured, 2 having a coating layer 1 through a splitting means 10 having a condenser lens system 3. The reflected lights L0, L1... from the surface, whose reflectivity is measured, 2 and the reflected light L-1 from a surface 1S of the coating layer 1 are split into the different light paths with the splitting means 10. Then, only the reflected lights L0, L1... from the surface, whose reflectivity is measured, 2 are introduced into a photodetector 4.</p>
申请公布号 JPH05256770(A) 申请公布日期 1993.10.05
申请号 JP19920055669 申请日期 1992.03.13
申请人 发明人
分类号 G01N21/55;(IPC1-7):G01N21/55 主分类号 G01N21/55
代理机构 代理人
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