发明名称 Dual-beam spectrometer
摘要 PCT No. PCT/DE90/00887 Sec. 371 Date Jul. 1, 1991 Sec. 102(e) Date Jul. 1, 1991 PCT Filed Nov. 19, 1990 PCT Pub. No. WO91/08454 PCT Pub. Date Jun. 13, 1991.The invention relates to a dual-beam spectrometer in which a measuring beam, after passage through a measuring cell, and a reference beam each travel through an entrance slit into a spectrometer. Both beams are spectrally separated by means of an optical grating. The spectrometer is intended to operate with a single photodiode array. According to the invention, the two entrance slits, the center of the grating and the measuring and reference spectra lie in one plane; both spectra are recorded on a single detector array, with the spectrum of the measuring beam of the +1 order directly following the spectrum of the reference beam of the -1 order.
申请公布号 US5251007(A) 申请公布日期 1993.10.05
申请号 US19910720757 申请日期 1991.07.01
申请人 KERNFORSCHUNGSZENTRUM KARLSRUHE GMBH;BERNATH ATOMIC GMBH & CO. KG 发明人 RINKE, GUENTER
分类号 G01J3/28;G01J3/36;G01J3/42;(IPC1-7):G01J3/42 主分类号 G01J3/28
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