摘要 |
PCT No. PCT/DE90/00887 Sec. 371 Date Jul. 1, 1991 Sec. 102(e) Date Jul. 1, 1991 PCT Filed Nov. 19, 1990 PCT Pub. No. WO91/08454 PCT Pub. Date Jun. 13, 1991.The invention relates to a dual-beam spectrometer in which a measuring beam, after passage through a measuring cell, and a reference beam each travel through an entrance slit into a spectrometer. Both beams are spectrally separated by means of an optical grating. The spectrometer is intended to operate with a single photodiode array. According to the invention, the two entrance slits, the center of the grating and the measuring and reference spectra lie in one plane; both spectra are recorded on a single detector array, with the spectrum of the measuring beam of the +1 order directly following the spectrum of the reference beam of the -1 order.
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