发明名称 Semiconductor memory apparatus having reduced amount of bit line amplification delay
摘要 In a DRAM formed of MOS FETs, respectively different values of substrate bias voltage are applied to transistors of different types of circuit in accordance with the circuit functions, to thereby enable the threshold voltage of the transistors of the sense amplifiers to be brought close to zero, thereby reducing the bit line amplification delay, while maintaining sufficiently high values of threshold voltage for other circuits.
申请公布号 US5251172(A) 申请公布日期 1993.10.05
申请号 US19910673981 申请日期 1991.03.25
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 YAMAUCHI, HIROYUKI
分类号 H01L27/10;G11C5/14;G11C11/401;G11C11/407;G11C11/4074;G11C11/408;G11C11/409;H01L27/02;H01L27/105;H01L27/108;(IPC1-7):G11C11/34;H01L27/06 主分类号 H01L27/10
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