发明名称 |
INSTANTANEOUS TEST MODE DESIGNATION CIRCUIT |
摘要 |
The designated circuit comprises a level detection part for detecting the level of input signal (VIN); a schmitt trigger circuit part for outputting a clock signal (CK) and stablizing the detected level from the detection part; a toggle for outputting a test enable signal (TESTEN) controlled by the clock signal (CK); and a latch circuit. The level detection part provides output in case the level of input signal (VIN) is less than the designated ground level.
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申请公布号 |
KR930009490(B1) |
申请公布日期 |
1993.10.04 |
申请号 |
KR19910012043 |
申请日期 |
1991.07.15 |
申请人 |
GOLDSTAR ELECTRON CO., LTD. |
发明人 |
KIM, HAK - KUN |
分类号 |
G01R31/28;G01R31/316;G01R31/317;G01R31/3185;G11C11/401;G11C29/00;G11C29/14;(IPC1-7):H03K19/00 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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