发明名称 INSTANTANEOUS TEST MODE DESIGNATION CIRCUIT
摘要 The designated circuit comprises a level detection part for detecting the level of input signal (VIN); a schmitt trigger circuit part for outputting a clock signal (CK) and stablizing the detected level from the detection part; a toggle for outputting a test enable signal (TESTEN) controlled by the clock signal (CK); and a latch circuit. The level detection part provides output in case the level of input signal (VIN) is less than the designated ground level.
申请公布号 KR930009490(B1) 申请公布日期 1993.10.04
申请号 KR19910012043 申请日期 1991.07.15
申请人 GOLDSTAR ELECTRON CO., LTD. 发明人 KIM, HAK - KUN
分类号 G01R31/28;G01R31/316;G01R31/317;G01R31/3185;G11C11/401;G11C29/00;G11C29/14;(IPC1-7):H03K19/00 主分类号 G01R31/28
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