| 摘要 |
<p>For the testing of an integrated monolithic circuit (IC) it is proposed to provide the integrated monolithic circuit with a test bus (tb) which extends along a functional part (F1, F2, ...) of the circuit which is partitioned into macro circuits (M1, M2) and which is coupled to the macro circuits, each macro circuit comprising a test interface circuit (T1, T2, ...) which is connected in series with test interface circuits of the other macro circuits; via the test interface circuits, the macro circuits can be coupled to the test bus. As a result, macro circuits can be separately tested and in the case of a hierarchic design of integrated circuits, utilizing previously designed macro circuits and test programs for previously designed macro circuits, test development times can be substantially reduced, this is an increasingly important aspect of increasingly complex circuits.</p> |
