发明名称 APPERANCE INSPECTING APPARATUS FOR ELECTRONIC PART
摘要 PURPOSE:To make it possible to perform correlation computaion and the judgment of a good or bad state without position compensation by providing the correlation between the pattern of a part to be inspected and a reference pattern in the vicinity of a part identifying line with the part identifying line as a reference. CONSTITUTION:A part B to be inspected, which is conveyed with a belt conveyer and the like, is made to pass at the lower side of a camera 1. The image of the upper surface of the part B is picked up. The image data are received with an image memory 2. At the same time, the luminance data in the direction along the axial line of the part B are read with a luminance data reading circuit 4 from the memory 2. Parts identifying lines having the different colors from the color of the outer applied painting of the part B are alternately present. Therefore, the local fluctuation, which agrees with the presence or absence of the line, appears in the luminance data. The peak position of the local fluctuation is obtained and stored in a memory 5. Then, the pattern of the part to be inspected in the vicinity of the peak position is read out of the memory 2 in a correlation computing circuit 6. The correlation of this pattern and the reference pattern from a reference memory pattern 3 is computed. A judging means 7 judges the good or bad state.
申请公布号 JPH05248829(A) 申请公布日期 1993.09.28
申请号 JP19920044903 申请日期 1992.03.02
申请人 TAIYO YUDEN CO LTD 发明人 TANAKA KAZUYUKI
分类号 B07C5/10;G01B11/24;G06T1/00;G06T7/00;G06T7/60 主分类号 B07C5/10
代理机构 代理人
主权项
地址