发明名称 PATTERN INSPECTING APPARATUS
摘要 PURPOSE:To improve inspecting accuracy by providing a means and the like, which can always control a threshold value so as to follow an actual level. CONSTITUTION:A signal generating means 52 generates a third signal corresponding to the sum of a first signal A and a second signal B, a fourth signal of the difference and a fifth signal of the rate of the sum and the difference. An analog signal alpha corresponding to the fifth signal is outputted from a height operating circuit 51. An analog signal beta corresponding to the third signal is outputted from a brightness operating circuit 52. An averaging circuit 56a of a variable-threshold-value setting circuit 52 generates and outputs a signal SIGMAalphathrough an integrating circuit. A sample-and-hold circuit 56b samples the signal SIGMAalpha from the circuit 56 at the specified timing and holds the value SIGMAalphaH. An offset circuit 56c adds a specified offset value to the SIGMAalphaH and generates a variable threshold value SL10. An accurate binary-coded signal alpha without the effect of high-frequency noises can be formed based on the variable threshold value. Thus, the inspecting accuracy of wirings and patterns can be improved.
申请公布号 JPH05248836(A) 申请公布日期 1993.09.28
申请号 JP19920048858 申请日期 1992.03.05
申请人 FUJITSU LTD 发明人 HIZUKA TETSUO;NAKAMURA YUTAKA;ANDO MORITOSHI
分类号 G01B11/24;G01R31/02;G06T1/00;H01L21/66 主分类号 G01B11/24
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