发明名称 |
MARCHING INTERCONNECTING LINES IN SEMICONDUCTOR INTEGRATED CIRCUITS |
摘要 |
In order to reduce parasitic capacitive cross-coupling in an integrated circuit, metallization lines in an array--for example, an array of word lines, of bit lines, or of bus interconnects--are topologically arranged in a systematically progressive marching sequence, whereby the identity of the lines located on one side (or on both sides) of a given line keeps changing. |
申请公布号 |
HK96093(A) |
申请公布日期 |
1993.09.24 |
申请号 |
HK19930000960 |
申请日期 |
1993.09.16 |
申请人 |
AMERICAN TELEPHONE AND TELEGRAPH COMPANY |
发明人 |
LEBOWITZ, JOSEPH;LYNCH, WILLIAM THOMAS |
分类号 |
H01L21/82;H01L21/3205;H01L21/8242;H01L23/52;H01L23/522;H01L23/528;H01L27/10;H01L27/108;(IPC1-7):H01L23/52 |
主分类号 |
H01L21/82 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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