发明名称 SEMICONDUCTOR THIN FILM AND PROCESS FOR FABRICATING THE SAME
摘要 An InP semiconductor thin film is formed by a process in which an amorphous GaAs buffer layer (2) having a good surface flatness, and then an amorphous InP buffer layer (3) having a good surface flatness are formed on an Si substrate (1), and then an InP monocrystalline thin film (4) is grown on the InP buffer layer (3). GaAs has a lattice constant intermediate between Si used as the substrate and InP, so the lattice mismatch is reduced.
申请公布号 EP0329400(B1) 申请公布日期 1993.09.22
申请号 EP19890301423 申请日期 1989.02.15
申请人 OKI ELECTRIC INDUSTRY COMPANY, LIMITED 发明人 HORIKAWA, HIDEAKI;AKIYAMA, MASAHIRO
分类号 H01L21/20;H01L21/205;H01L31/18 主分类号 H01L21/20
代理机构 代理人
主权项
地址