| 摘要 |
PURPOSE:To simply perform the test of a pair of switches in a matrix shape. CONSTITUTION:Incoming lines I0-I7 are connected to a space switch 2 via an input data latch 1, and a space switch 2 to a normal/test changeover switch 12. A normal/test changeover switch 13 is connected through a serial/parallel conversion circuit 3, comnon buffer memory 4, parallel/serial conversion circuit 5. A space switch 6 is connected to the switch 13. Outgoing lines O0-O7 are connected to the space switch 6 through an output data latch 8. At the test, the switches 2 and 6 invert the connection by an inversion connection generation circuit 10 to be connected directly by means of the switches 12 and 13. Thus, the prescribed data to be given as an expectation to the incoming lines can be used as it is in discriminating whether the operation is normal. |
