| 摘要 |
PURPOSE:To generate 64 optimized test specifications by optimizing a test specification by the use of the results of previous tests, and automatically generating the test specification according to data obtained from the standard of a product to be tested. CONSTITUTION:In the case of a test specification of LSI, for example, the test specification of LSI is calculated and determined by a generating and processing portion 47 according to a product standard 41, a rule 42 of conditions for calculating an LSI operating timing margin, an algorithm 43 for computing applied voltages and source voltages, a test specification template 44, process data 45, and simulation data 46 for use in designing circuits, and this basic specification is stored in a file 48. Data about failure during a test are retrieved by a collecting portion 51 from an LSI tester 49 and a tester workstation 50, and are stored in a failure case database 52. The data of the file 48 are subjected to optimization at an optimization processing portion 54. A failure information sorting/extracting portion 53 extracts data about the history of failure from the base 52 and delivers it to the processing portion 54, and the processing portion 54 performs optimization by consulting the data, and then the data are output from a test specification data output portion 55. |
