发明名称 COATING METHOD OF PHOTO RESIST
摘要 The method increases or decreases the RPM of the spinner by times to adjust the coating uniformity and the coating thickness. To coat photo resist in a curved pattern following the stepped first and second patterns on the wafer, the spinner RPM is increased to a scheduled 2nd stage RPM to be maintained for a scheduled time during which to RPM is increased to the prearranged 3rd stage for 1-2 sec. and return to the 2nd stage RPM for maintaining.
申请公布号 KR930008859(B1) 申请公布日期 1993.09.16
申请号 KR19910008408 申请日期 1991.05.24
申请人 HYUNDAI ELECTRONICS CO., LTD. 发明人 SONG, KI - HUN
分类号 H01L21/31;(IPC1-7):H01L21/31 主分类号 H01L21/31
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