发明名称 SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING SAME
摘要 <p>A semiconductor structure is provided by forming an isolation region in a portion of a semiconductor layer, forming a doped region in the semiconductor layer adjacent the isolation region, such doped region having a conductivity type opposite the conductivity type of the semiconductor layer, selectively masking a surface of the semiconductor layer exposing a portion of the doped region adjacent to the isolation region, and selectively etching the exposed portions of the adjacent doped region forming a depression having converging side walls separated from the isolation region by portions of the doped region. The semiconductor layer is an epitaxial layer providing the collector region of a transistor. The bottom portion of the depression is lightly doped to provide an active base region for the transistor. The active base region is electrically connected to the base contact through the more heavily doped region formed in the semiconductor layer. A doped polycrystalline silicon layer is formed over the bottom portion of the depression in contact with the active base region to provide an emitter contact for the transistor.</p>
申请公布号 JPS55157258(A) 申请公布日期 1980.12.06
申请号 JP19800069998 申请日期 1980.05.26
申请人 RAYTHEON CO 发明人 UORUFUGANGU MAACHIN FUEISUTO
分类号 H01L21/8222;H01L21/306;H01L21/331;H01L21/76;H01L21/762;H01L27/06;H01L29/10;H01L29/73;H01L29/737 主分类号 H01L21/8222
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