发明名称 MANUFACTURING MTHOD FOR MOS FIELDDEFFECT TRANSISTOR
摘要 PURPOSE:To make a MOS integrated circuit of a high integration by giving a rotating application of a liquid-type material having a mask effect on a silicon nitriding film and also by giving an etching after removing the applied material from the top section of a polycrystalline silicon gate electrode. CONSTITUTION:A field oxidation film 12, a gate oxidation film 13, a polycrystalline silicon gate 14 and an oxidation film 15 are formed on a P-type silicon substrate 11. Then a silicon nitriding film 16 is grown on the said substrate, and after giving a rotating application of a photo resist 17, an etching is given to the resist until the silicon nitriding film 16 is exposed. Then this is used as a mask and an oxidation film 19 is exposed by etching. After giving a heat oxidation and an etching to the silicon nitriding film, gate oxidation films 22 and 22' are etched, source/drain diffusion layers 24 and 24' are formed by diffusion, wiring metal layers 25 and 25' are formed and the manufacture of an element is completed.
申请公布号 JPS55157265(A) 申请公布日期 1980.12.06
申请号 JP19790065450 申请日期 1979.05.25
申请人 NIPPON ELECTRIC CO 发明人 OSHISHIBA KEIMEI
分类号 H01L29/417;H01L29/78 主分类号 H01L29/417
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