发明名称 Apparatus and method for etching semiconductor wafer.
摘要 <p>A semiconductor wafer etching apparatus capable of anisotropically etching a large-diameter semiconductor wafer with high accuracy without causing the semiconductor wafer to be charged. The semiconductor wafer etching apparatus has a fast atom beam source (4) for generating an electrically neutral fast atom beam of gas atoms or molecules to etch a semiconductor wafer by using the fast atom beam. &lt;IMAGE&gt;</p>
申请公布号 EP0559233(A1) 申请公布日期 1993.09.08
申请号 EP19930103995 申请日期 1993.03.05
申请人 EBARA CORPORATION 发明人 SUZUKI, HIDENAO;HATADA, YOSHIO;NISHIMURA, TATSUYA
分类号 H01L21/302;H01J37/02;H01L21/3065;H01L21/311;H01L21/3213 主分类号 H01L21/302
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