| 摘要 |
The data-transmission line (DS) has a digital test-sequence (a) fed into it at the input end. An output sequence received is correlated, by means of a cyclically bitwise shifted exclusive-OR function (EXOR) followed by check-sum formation to form a dual cross-correlation (KKFd), with a reference sequence (R) corresponding to the test sequence. The number of defective bits (BF) is immediately apparent from the low-order positions of the extreme value (EX) of the cross-correlation function (KKFd). |
