IC TEST EQUIPMENT,申请号EP19890122929-传众专利搜索

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发明名称	IC TEST EQUIPMENT
摘要
申请公布号	EP0432291(B1)	申请公布日期	1993.09.01
申请号	EP19890122929	申请日期	1989.12.12
申请人	ADVANTEST CORPORATION	发明人	HASHIMOTO, YOSHIHIRO;YAMAZAKI, SHOJI;KATOH, SHUNSUKE
分类号	G01R31/30	主分类号	G01R31/30
代理机构		代理人
主权项
地址

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