| 摘要 |
<p>This device is characterised in that it comprises a laser source (1) provided with means (3) for focusing the beam emitted by the source, which are adapted to emit a beam on an optical path (5) towards an inspection head (12) extending in the tube (T) and whose position is controlled by displacement means in a helical movement, the head (4) comprising means (9) for deflecting the beam emitted onto the path, towards the internal surface of the tube (T) and the beam reflected thereby onto the path (5), means (11) for deflecting the reflected beam, which are arranged on the path (5) and adapted to deflect at least part of the reflected beam towards analysis means (12) connected to means (13, 14) for driving the means (3) for focusing the beam emitted onto the path, for keeping this beam focused on the internal surface of the tube and to means (14) for mapping the internal surface of the tube (T), from the output data of these analysis means and from the position of the inspection head (4). <IMAGE></p> |
