发明名称 Non-volatile DRAM cell.
摘要 <p>The present invention is directed to a one-transistor non-volatile DRAM cell (10, 40, 66, 79) having a two layer floating gate (14) to allow the contents of a storage capacitor (28) to be transferred to the floating gate (14) during power interruptions. The first layer (18) of the floating gate (14) is separated from a storage node (32) of the storage capacitor (28) by a tunnel oxide (92) to allow electron tunnelling between the floating gate (14) and the storage capacitor (32). In another embodiment of the present invention, a dual electron injector structure (44) is disposed between a one layer floating gate (42) and the storage node (32) to allow electrons to be injected between the floating gate (42) and the storage node (32). In another embodiment of the present invention, an erase gate (70) is implemented to remove the charge on the floating gate (14, 42). The erase gate (70) can be separated from the floating gate (14, 42) by a tunnel oxide (92) or a single electron injector structure (44) to allow electrons to travel from the floating gate (14, 42) to the erase gate (70). &lt;IMAGE&gt;</p>
申请公布号 EP0557581(A2) 申请公布日期 1993.09.01
申请号 EP19920118487 申请日期 1992.10.29
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 ACOVIC, ALEXANDRE;HSU, CHING-HSIANG, DEP. OF ELECTRICAL ENGINEERING;WORDEMAN, MATTHEW ROBERT;WU, BEING SONG
分类号 H01L27/105;G11B17/028;G11C14/00;H01L21/8247;H01L29/788;H01L29/792;(IPC1-7):G11C14/00 主分类号 H01L27/105
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