发明名称 PROCESS AND DEVICE FOR THE ULTRASONIC MEASUREMENT OF THE WALL THICKNESS OF A PART OF SYNTHETIC PLASTIC MATERIAL
摘要 TITLE OF THE INVENTION PROCESS AND DEVICE FOR THE ULTRASONIC MEASUREMENT OF THE WALL THICKNESS OF A PART OF SYNTHETIC PLASTICS MATERIAL Measurement of the thickness of a synthetics plastics layer is effected at a point between an extruder and a cooling trough where the object to be measured is freestanding. Two diametrically opposite ultrasonic measuring heads are given an oscillating rotary movement through 180.degree. about the object to be measured. The measuring heads comprise an ultrasonic source in a measurement chamber opening towards the object to be measured which chamber is continuously supplied with water via a flexible conduit so that a water column is formed between the ultrasonic source and the object to be measured. As a result of this arrangement the wall thickness of the synthetic plastics layer leaving the extruder can be measured at a position where this synthetic plastics layer still has a high, uniform temperature and thus there is within the layer a uniformly definable velocity of sound. As a result of full electronic detection and evaluation of the measurement values according to a multiplex system, a rapid measurement with a high density of points of measurement is possible.
申请公布号 CA1321825(C) 申请公布日期 1993.08.31
申请号 CA19880580442 申请日期 1988.10.18
申请人 ZUMBACH ELECTRONIC AG 发明人 STUDER, URS P.
分类号 G01B17/02 主分类号 G01B17/02
代理机构 代理人
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