发明名称 Method for forming a semiconductor device
摘要 The surface area of a polysilicon electrode is increased by sputtering non-coalescing islands (20) of aluminum onto a silicon dioxide layer (18), which is overlying the polysilicon electrode. The sputtering process allows uniform island formation to be achieved independent of the deposition surface. The non-coalescing islands are then used as a mask, and a portion of the buffer layer (22) and a portion of the polysilicon electrode (26) are etched to form pillar-like regions (30) within the polysilicon electrode.
申请公布号 US5240558(A) 申请公布日期 1993.08.31
申请号 US19920967294 申请日期 1992.10.27
申请人 MOTOROLA, INC. 发明人 KAWASAKI, HISAO;SHARMA, UMESH;KIRSCH, HOWARD C.
分类号 H01L21/02;H01L21/033;H01L21/311;H01L21/8242 主分类号 H01L21/02
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