发明名称 ABNORMALITY DIAGNOSTIC APPARATUS
摘要 <p>PURPOSE:To enable the rearrangement of knowledge and the ensuring of quality by facilitating handling during maintenance, etc., even when knowledge obtained in the diagnosis of causes utilized in the trouble shooting increases corresponding to the increasing of the number of events observed and causes obtained. CONSTITUTION:The state of a diagnostic object 100 is measured by measuring means 210-240 to be inputted into an observation signal processing means 300. The observation signal processing means 300 processes an observation data to be stored into a data memory means 350 while being outputted to an abnormal event judging means 400. The abnormal event judging means 400 judges a characteristic abnormal event among a plurality of abnormal events based on the observation data and a memory data of the data memory means 350. Causes are identified by a plurality of trouble shooting means 510 about the abnormal events thus judged and the explanation of causes of troubles is displayed on a cause of trouble explanation display means 600 while repairing/ restoring operation is presented by a repairing/restoring operation presentation means 700.</p>
申请公布号 JPH05223604(A) 申请公布日期 1993.08.31
申请号 JP19920025198 申请日期 1992.02.12
申请人 MITSUBISHI HEAVY IND LTD 发明人 HOSAKA SHIGETAKA;TAKESHITA KOJI;HANADA TATSUMICHI
分类号 G01D21/00;G05B23/02;G21C17/00 主分类号 G01D21/00
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