发明名称 Circuit testing system.
摘要 <p>The present invention relates to the field of circuit assembly testing systems and provides improved systems and methods for debugging circuit test systems and diagnosing faults in circuit assemblies. An expert system (74) derives possible root causes of test failures, predicts test results based on these possible root causes and uses factual observations to refute inconsistent hypothetical root causes. Tests useful in refuting inconsistent hypothetical root causes are devised and run automatically by the system. <IMAGE></p>
申请公布号 EP0557628(A1) 申请公布日期 1993.09.01
申请号 EP19920301573 申请日期 1992.02.25
申请人 HEWLETT-PACKARD COMPANY 发明人 LOOPIK, ALEX;CROOK, DAVID
分类号 G01R31/28 主分类号 G01R31/28
代理机构 代理人
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