| 摘要 |
PURPOSE:To efficiently perform an operating test for hardware in an information processor in a short time by selecting a test item in accordance with a past abnormality occurrence ratio. CONSTITUTION:An operating history storage part 5 which stores the number of times of a test, the number of times of occurrence of abnormality, and the abnormality occurrence ratio by conforming to classification by every test targeted hardware, a test item table storage part 4 which stores a test item table conforming the abnormality occurrence ratio to the test item classified by every test targeted hardware are provided. When a test instruction decided in advance and an instruction to select the test targeted hardware are inputted to a CPU 2 in the information processor 1, the CPU 2 refers to the operating history storage part 5, and makes it read out the abnormality occurrence ratio of selected test targeted hardware, and furthermore, makes the test item table storage part 4 read out the test item in accordance with the abnormality occurrence ratio, and executes the test for the test item of hardware selected by a program stored in a test program storage part 3. |
