发明名称 TEST METHOD AND TEST DEVICE FOR FRAME MEMORY
摘要 PURPOSE:To provide a test method and a test device for a frame memory which can automatically execute a test of a frame memory composing a frame memory of double buffer system in the quite same conditions as the actual operations without depending on visual confirmation or the like. CONSTITUTION:When a frame memory 101 of one of a double buffer system is tested, the other frame memory 102 is used as a test buffer, display data outputted from a SAM 107 of a VRAM 103 of n pieces which composes the frame memory 101 in the same conditions as the actual operation is inputted to a SAM 108 of a VRAM 104 of n pieces which composes the frame memory 102, contents of the frame memory 101 is compared with contents of the frame memory 102, and information about malfunction parts of the VRAM 103 of n pieces which composes the frame memory 101 is collected.
申请公布号 JPH05216448(A) 申请公布日期 1993.08.27
申请号 JP19920019168 申请日期 1992.02.04
申请人 HITACHI LTD;HITACHI PROCESS COMPUT ENG INC 发明人 KAWAMATA WATARU;SUEOKA MAMORU;NISHIDA TAKEHIKO;SUZUKI KUNIO;YOKOYAMA MASAHIRO
分类号 G06F11/22;G06F12/16;G09G5/00;G09G5/36;G09G5/397;G09G5/399;G11C29/00;G11C29/04;G11C29/56 主分类号 G06F11/22
代理机构 代理人
主权项
地址