发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURE THEREOF
摘要 PURPOSE:To control the short channel effect in MOS transistors. CONSTITUTION:An N-type diffusion layer 2 for source, rectangular in plane shape, is formed; a P-type epitaxial layer 6 is formed thereon; and an N-type diffusion layer 10 for drain is formed thereon in turn. A word line 8 is formed on the four sidewalls of the epitaxial layer 6 with a gate oxide film 7 in-between. Insulation is provided by a thick silicon oxide film 3 between the word line 8 and the source 2; insulation is provided by another thick silicon oxide film 15 between the word line 8 and the drain 10. The channel is longitudinally formed in the epitaxial layer 6.
申请公布号 JPH05218338(A) 申请公布日期 1993.08.27
申请号 JP19920046066 申请日期 1992.01.31
申请人 RICOH CO LTD 发明人 KAWABATA NAOKI;FUCHINO FUMIHIRO
分类号 H01L27/10;H01L21/8242;H01L27/108;H01L29/78 主分类号 H01L27/10
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