发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURE THEREOF |
摘要 |
PURPOSE:To control the short channel effect in MOS transistors. CONSTITUTION:An N-type diffusion layer 2 for source, rectangular in plane shape, is formed; a P-type epitaxial layer 6 is formed thereon; and an N-type diffusion layer 10 for drain is formed thereon in turn. A word line 8 is formed on the four sidewalls of the epitaxial layer 6 with a gate oxide film 7 in-between. Insulation is provided by a thick silicon oxide film 3 between the word line 8 and the source 2; insulation is provided by another thick silicon oxide film 15 between the word line 8 and the drain 10. The channel is longitudinally formed in the epitaxial layer 6. |
申请公布号 |
JPH05218338(A) |
申请公布日期 |
1993.08.27 |
申请号 |
JP19920046066 |
申请日期 |
1992.01.31 |
申请人 |
RICOH CO LTD |
发明人 |
KAWABATA NAOKI;FUCHINO FUMIHIRO |
分类号 |
H01L27/10;H01L21/8242;H01L27/108;H01L29/78 |
主分类号 |
H01L27/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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