发明名称 Method of making solid-state imaging device
摘要 A method for producing a solid-state imaging device including a photodetector including implanting two different dopant impurity ions, each producing the second conductivity type and having different diffusion coefficients in a first conductivity type semiconductor layer; thermally diffusing the implanted ions to produce a second conductivity type region including a relatively deep second conductivity type subregion and a relatively shallow second conductivity type region having a higher dopant impurity concentration than said relatively deep second conductivity type subregion; forming a charge transfer electrode on said semiconductor layer such that an edge of said electrode lies adjacent part of the junction between said semiconductor layer and said second conductivity type region; and implanting a dopant impurity producing the first conductivity type in said second relatively shallow second conductivity type subregion using said charge transfer electrode as a mask to produce a first conductivity type impurity diffusion region shallower than said relatively shallow second conductivity type subregion.
申请公布号 US5238864(A) 申请公布日期 1993.08.24
申请号 US19920974076 申请日期 1992.11.10
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 MAEGAWA, SHIGETO;SAKAKIBARA, KIYOHIKO;YAMAMOTO, HIDEKAZU
分类号 H01L27/148;H01L29/768;H01L31/101;H01L31/103 主分类号 H01L27/148
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