发明名称 |
Method for measuring surface roughness of honeycomb structures and surface roughness-measuring elements used therefor |
摘要 |
A method for measuring surface roughness of an end face of a honeycomb structure having a plurality of cells by using a stylus having a width corresponding to a width of at least two cells. A honeycomb surface roughness-measuring element, which is adapted for the measurement of a surface roughness of an end face of a honeycomb structure, includes a stylus having a tip, said tip having a widened edge with a width of 2 to 8 mm and a radius of curvature of 1 to 5 mu m.
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申请公布号 |
US5237860(A) |
申请公布日期 |
1993.08.24 |
申请号 |
US19910716113 |
申请日期 |
1991.06.17 |
申请人 |
NGK INSULATORS, LTD. |
发明人 |
KATO, HISAYOSHI;KAWASAKI, KEIJI |
分类号 |
G01B5/012;G01B5/20;G01B5/28 |
主分类号 |
G01B5/012 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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