发明名称 INSPECTING MATERIAL DETECTING METHOD
摘要 PURPOSE:To perform stable inspecting material detection independently of the level of the inspecting material density, by selecting an inspecting material detecting part having the largest density difference for the bright level to perform detection in the inspecting material detecting unit used for the colorimetric determination method of fractionated pictures of serum and so on. CONSTITUTION:Light emitting diodes 31-38 are lit successively. Transmission outputs Va1-Va8 and Vb1-Vb8 of respective light emitting diodes for respective cases according to light quantities which photodetector 40 receives through the transparent part of support material 1 and inspection material 2' in position Y1 are stored in a computer. A light emitting diode of the largest (Van-Vbn)/Van is selected, and selected, and detection reference level Vr is determined as shown by expression (1) on the basis of transmission outputs Vai and Vbi of the selected diode. When support material 1 is transferred and transmission outputs of the selected diode exceeds Vr, terminal Y2 of inspecting material 2' is detected, and transfer of the support material is stopped when inspecting material 2' reaches positions of measuring systems 3 and 8. Next inspecting material 2'' comes to the original position of inspecting material 2', and the same operation inspection material 2' is repeated.
申请公布号 JPS55164336(A) 申请公布日期 1980.12.22
申请号 JP19790072074 申请日期 1979.06.08
申请人 OLYMPUS OPTICAL CO 发明人 FUJIWARA TOSHIHIDE;KANEKO NOBUTAKA
分类号 G01N21/17;G01N21/27;G01N21/86;G01N27/447;G01N35/00;G01V8/16 主分类号 G01N21/17
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