发明名称 AUTO-TESTING CIRCUIT
摘要 The tester circuit tests hardware and software of a system which has CPU with ease. The tester includes an address decoder (40) for decoding address signal transmitted from a CPU (10), a latch (50) for generating a first and a second signal according to output signal of the address decoder (40) and data signal transmitted from a CPU (10), a pulse generator (70), a pulse generator (70) for generating pulse signal synchronized to CPU operation when a first signal is received, a pulse counter (60) for counting operating steps of a CPU (10) when a third mode signal is received, and a multistep driver (100) for generating and transmitting a first and a third mode signal to operate a CPU (10) step by step.
申请公布号 KR930007930(B1) 申请公布日期 1993.08.21
申请号 KR19910002840 申请日期 1991.02.21
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, YONG - KUN
分类号 G06F11/22;(IPC1-7):G06F11/22 主分类号 G06F11/22
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