发明名称 |
MANUFACTURE OF BOTTOM RESIST |
摘要 |
PURPOSE: To produce a double layer O2 /RIE(Reactive Ion Etching) based bottom resist satisfying all necessary conditions setted to such a kind of a resist and particularly capable of being easily removed. CONSTITUTION: The bottom resist is produced by applying a lacquer layer consisting of an aromatic-containing base polymer, a reticulating agent and an acid generating material on a substrate, exposing with floodlamp the lacquer layer to liberate a strong acid from the acid generating material in the surface zone of the layer and curing by heating. |
申请公布号 |
JPH05210243(A) |
申请公布日期 |
1993.08.20 |
申请号 |
JP19920279430 |
申请日期 |
1992.09.24 |
申请人 |
SIEMENS AG |
发明人 |
RAINAA ROISHIYUNAA;REKAI ZECHI;MIHIAERU ZEBARUTO |
分类号 |
G03F7/039;G03F7/038;G03F7/09;G03F7/095;G03F7/11;G03F7/26;H01L21/027 |
主分类号 |
G03F7/039 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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