发明名称 MANUFACTURE OF BOTTOM RESIST
摘要 PURPOSE: To produce a double layer O2 /RIE(Reactive Ion Etching) based bottom resist satisfying all necessary conditions setted to such a kind of a resist and particularly capable of being easily removed. CONSTITUTION: The bottom resist is produced by applying a lacquer layer consisting of an aromatic-containing base polymer, a reticulating agent and an acid generating material on a substrate, exposing with floodlamp the lacquer layer to liberate a strong acid from the acid generating material in the surface zone of the layer and curing by heating.
申请公布号 JPH05210243(A) 申请公布日期 1993.08.20
申请号 JP19920279430 申请日期 1992.09.24
申请人 SIEMENS AG 发明人 RAINAA ROISHIYUNAA;REKAI ZECHI;MIHIAERU ZEBARUTO
分类号 G03F7/039;G03F7/038;G03F7/09;G03F7/095;G03F7/11;G03F7/26;H01L21/027 主分类号 G03F7/039
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