| 摘要 |
PURPOSE:To restrict the number of notified defects to minimum by integrating extracted defective pixels showing the distance therebetween not larger than predetermined (m) pixels into one group, and operating and notifying the representative coordinates of the group. CONSTITUTION:A wiring pattern on a printed board is illuminated by a scattering illuminating device. The dark-and-bright image obtained by an image input means 101 provided with a CCD camera is compared with a predetermined threshold value by a binarizing means 102, so that the image is converted to a binary image wherein a part of the wiring pattern is expressed by 1 and a part of a base material is represented by 0. The binary image is compared with a standard pattern in a defect extracting means 103, and a defect of the wiring pattern is extracted. As a result, an image from which the defect is extracted is output. In a defective pixel integrating means 104, the connecting characteristic of a target pixel with the peripheral defective pixels is determined if the target pixel is defective. When the target pixel shows the connectivity with the peripheral defective pixels, the pixels are treated in one group and the coordinates of the group are registered. The connected pixels are the pixels the distance of which is not larger than predetermined (m) pixels. When the extracted images are completely scanned, the representative coordinates of each group are calculated and notified. |
